Åtgärdat kommentarer från Gunnar. Fixat avtal för att publicera exjobb. Kompilerat v1.0 och skickat in till Micke.

rapport/conclusion.tex

@@ -35,7 +35,7 @@
 \label{cha:conclusion}
 
 %%%%%%%%%%%%%%%%%%%%%%%
-The main goal of this thesis was to examine the potential of reusing old test equipment with newer standards and how to assure that the results are reliable. A method to verify the test equipment according to the latest standard was suggested in this thesis and some considerations for automating this procedure was made. A dummy load was developed and found good enough to be used for verification. The verification system was not completed and the high frequency attenuators did not perform well enough to be used in their current form.
+The main goal of this thesis was to examine the potential of reusing old test equipment with newer standards and how to ensure that the results are reliable. A method to verify the test equipment according to the latest standard was suggested in this thesis and some considerations for automating this procedure was made. A dummy load was developed and found good enough to be used for verification. The verification system was not completed and the high frequency attenuators did not perform well enough to be used in their current form.
 
 \section{Research Questions}
 The answers to the research questions are here answered based on the results of the project.

rapport/discussion.tex

@@ -49,7 +49,7 @@ As can be seen in \autoref{tab:initial_measurements} and \autoref{tab:initial_me
 
 %%%%%%%%%%%%%%%%%%%%%%%%
 \subsection{Test architecture}
-The chosen architecture, with the embedded attenuators, proved to be difficult to implement because of the high frequency design involved. In the future, it might be better to develop a more manual procedure using off the shelf attenuators and a check list. It might be possible to automate the analysis of the results even if the connection of the verification equipment must be made automatically.
+The chosen architecture, with the embedded attenuators, proved to be difficult to implement because of the high frequency design. In the future, it might be better to develop a more manual procedure using off the shelf attenuators and a check list to mitigate human errors in these manual steps. It might be possible to automate the analysis of the results even if the connection of the verification equipment must be made manually.
 
 %%%%%%%%%%%%%%%%%%%%%%%%
 \subsection{Design of dummy loads}
@@ -59,7 +59,7 @@ The results are well within the \SI{1}{\percent} specified by the standard \cite
 \subsection{Design of the switching fixture and the embedded attenuators}
 The attenuators were not populated with compensation capacitors. The results are, in the attenuators current state, not feasible for usage in calibrating the equipment. The required bandwidth for the attenuators must be \SI{400}{\mega\hertz} or greater. The simulated results indicated that this would be the case and that the attenuators will need compensation. But since the actual parasitics in the PCB traces and the design in whole is difficult to know beforehand, the capacitors were left out to start with.
 
-The measured results were pretty unstable and difficult to correlate to the simulated results. Notable is that the phase response for the constructed and the simulated attenuator, seen in \autoref{fig:50-ohm-comparison-result-response} and \autoref{fig:1k-ohm-comparison-result-response}, is of opposite sign. This suggests that the parasitic characteristics are very different in the simulation and the real circuit. Therefore, it is improbable that the compensation capacitors used in the simulation would help in the real world case, at least not with the simulated values. One possible way of going forward with this would be to adjust the simulation model until it matches the real world. Then if a working compensation is found in the simulation, it might work in the real circuit as well. There was, however, no time left in the project to experiment with this.
+The measured results were pretty unstable and difficult to correlate to the simulated results. Notable is that the phase response for the designed and the simulated attenuator, seen in \autoref{fig:50-ohm-comparison-result-response} and \autoref{fig:1k-ohm-comparison-result-response}, is of opposite sign. This suggests that the parasitic characteristics are very different in the simulation and the real circuit. Therefore, it is improbable that the compensation capacitors used in the simulation would help in the real world case, at least not with the simulated values. One possible way of going forward with this would be to adjust the simulation model until it matches the real world. Then if a working compensation is found in the simulation, it might work in the real circuit as well. There was, however, no time left in the project to experiment with this.
 
 %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Method}

rapport/intro.tex

@@ -39,7 +39,7 @@ The standards state that the product shall withstand a certain level of disturba
 To test if a product complies with this standard, there is equipment that simulates different events on the power supply lines. The test events consist of test pulses that are applied to the Device Under Test (DUT). The pulses of interest in this paper are denoted pulse 1, pulse 2a, pulse 3a, pulse 3b and load dump test A. The standard defines different scenarios, raise and fall times of test pulses, repetition times, etc. It also defines the functional requirements of the equipment during these tests for what is considered a passed or a failed test. \cite{iso_7637_2, iso_16750_2}
 
 \section{Motivation}
-The standard defines all the timing requirements that must be met and also specifies the load conditions for which the requirements apply \cite{iso_7637_2}. From time to time the standards are revised, which may alter the requirements from the previous versions of the standard. Test equipment might be constructed for the currently valid standards, and possibly older versions, but might not be compatible with newer versions. New equipment might not be affordable by smaller test labs and can thus inhibit labs from performing tests for these newer standards.
+The standard defines all the timing requirements that must be met and also specifies the load conditions for which the requirements apply \cite{iso_7637_2}. From time to time the standards are revised, which may alter the requirements from the previous versions of the standard. Test equipment might be designed for the currently valid standards, and possibly older versions, but might not be compatible with newer versions. New equipment might not be affordable by smaller test labs and can thus inhibit labs from performing tests for these newer standards.
 
 An appealing alternative is the possibility to reuse the test equipment that was used along with the older revision of the standard, as long as it is capable of performing the tests reliably. To make this possible, the test equipment must be verified in order to guarantee that the tests are performed according to the new standard.
 
@@ -95,7 +95,7 @@ The result chapter is tightly coupled to the method chapter, in such a way that
 
 The discussion chapter reflects on the results achieved and comments on the methods used. This is also where source critisism is brought up.
 
-The conclusion chapter reconnects the project to the original research questions. There are also some suggestions for topics that need further research related to the project.
+The conclusion chapter reconnects the project to the original research questions. There are also some suggestions for topics that need further research related to the subject.
 
 %\nocite{scigen}
 %We have included Paper \ref{art:scigen}

rapport/method.tex

@@ -36,9 +36,9 @@ This chapter covers the methodologies used during the project.
 
 %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Prestudy}
-During the project efforts were made to find relevant research using Linköping University Library's\footnote{\url{https://liu.se/en/library/}} and Google Scholar's\footnote{\url{https://scholar.google.se/}} search engines.
+During the project, efforts were made to find relevant research using Linköping University Library's\footnote{\url{https://liu.se/en/library/}} and Google Scholar's\footnote{\url{https://scholar.google.se/}} search engines.
 
-Since the equipment intended for this project was untested before the project start, the first step was to hook it up and make some initial measurements to be able to decide the continuation of the project.
+Since the equipment intended for this project was untested before the project had started, the first step was to hook it up and make some initial measurements to be able to decide the continuation of the project.
 
 If the equipment is in line with the new standard requirements, the project will go along the following path:
 \begin{enumerate}
@@ -71,7 +71,7 @@ Since the equipment used in the project is designed for the older version of the
 \section{Examination and Initial Measurement of the Old Equipment}
 To decide the continuation of the project, the equipment first had to be inspected to see if it is capable to operate within the limits for use with the newer standard. This was done as a verification as specified by the standard, described in \autoref{sec:theory:verification}. Only the open load measurements could be done, since no dummy loads were available at this time in the project.
 
-With exception for Pulse 3a and Pulse 3b, all of the pulses were measured with the use of the high voltage differential probe described in \autoref{sec:hv-diff-probe}. The pulses are measured both directly on each generator connected according to \autoref{fig:manual-measurement-hv-diff} and also through the coupling network CNA~200, as depicted in \autoref{fig:manual-measurement-hv-diff-cna}.
+With exception for Pulse 3a and Pulse 3b, all of the pulses were measured with the use of the high voltage differential probe described in \autoref{sec:hv-diff-probe}. The pulses are measured directly on each generator connected according to \autoref{fig:manual-measurement-hv-diff} and also through the coupling network CNA~200, as depicted in \autoref{fig:manual-measurement-hv-diff-cna}.
 
 \begin{figure}[H]
 	\centering
@@ -108,7 +108,7 @@ Test pulse 3a and 3b was measured using the attenuators described in \autoref{se
 
 %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Test Architecture}
-The total number of tests needed to verify the testing equipment before each product test is 14, according to \autoref{tab:verification-list}. There are in total three different values for dummy loads. In practice these could be represented by two high frequency attenuators for pulse 3a and pulse 3b, since these have really short rise times that will be affected much by parasitics of components, and three different high power dummy loads for the slower pulses where the parasitic effects might be negligible but the ability to withstand power must be higher.
+The total number of tests needed to verify the test equipment before each product test is 14, according to \autoref{tab:verification-list}. There are in total three different values for dummy loads. In practice these could be represented by two high frequency attenuators for pulse 3a and pulse 3b, since these have really short rise times that will be affected much by parasitics of components, and three different high power dummy loads for the slower pulses where the parasitic effects might be negligible but the ability to withstand power must be higher.
 
 The following test architectures were considered, together with the external supervisor at the company. The company has a testing framework that is capable of controlling GPIB-compatible equipment which will be used to control the generators and measurement equipment in the future.
 
@@ -144,7 +144,7 @@ The dummy loads for all pulses, but Pulse 3a and Pulse 3b, will need to be put i
     \label{fig:test_setup_automatic_external}
 \end{figure}
 
-The advantage of this method is that the verification can be performed fully automatically, except for the initial connection of the test rig. This also uses the commercially created attenuators that are already available.
+The advantage of this method is that the verification can be performed fully automatically, except for the initial connection of the test rig. This also uses the commercially attenuators that are already available.
 
 The disadvantage to this setup is that the fixture needs to be designed, making the development costs greater. The fixture that attaches to the generator will expose high voltage on its measurement connectors, making it a safety hazard for the test operator.
 
@@ -212,7 +212,7 @@ Based on the energy in each load, the minimum number of resistances could be ach
 \subsection{PCB}
 \label{sec:dummy_load_pcb}
 
-Since most of the test pulses exceedes the properties of most resistors available, the dummy loads will be constructed of many resistors to share the power. It was decided to design a circuit board to connect all the discrete resistors. Not only does a PCB ease the connectivity of many components, it also gives good mechanical control of the resistors and the possibility to design for good heat dissipation.
+Since most of the test pulses exceeds the properties of most resistors available, the dummy loads will be designed with many resistors to share the power. It was decided to design a circuit board to connect all the discrete resistors. Not only does a PCB ease the connectivity of many components, it also gives good mechanical control of the resistors and the possibility to design for good heat dissipation.
 
 Both the circuit schematic and layout editing of the board were performed in the free EDA, Electronic Design Automation, tool KiCad\footnote{KiCad EDA \url{http://kicad-pcb.org/}}.
 
@@ -246,7 +246,7 @@ The relays were chosen based on high breakdown voltage between open contacts.
 
 %%%%%%%%%%%%%%%%%%%%%%%%
 \subsection{Attenuators}
-The target attenuation was decided to mimic the commercial attenuators, introduced in \mbox{\autoref{sec:hv-attenuators}}, where the \SI{50}{\ohm} attenuator has an attenuation of \SI{54.7}{\deci\bel} and the \SI{1000}{\ohm} attenuator has an attenuation of \SI{60.1}{\deci\bel}.
+The target attenuation was decided to mimic the commercially available attenuators, introduced in \mbox{\autoref{sec:hv-attenuators}}, where the \SI{50}{\ohm} attenuator has an attenuation of \SI{54.7}{\deci\bel} and the \SI{1000}{\ohm} attenuator has an attenuation of \SI{60.1}{\deci\bel}.
 
 The two attenuators were implemented as $\Pi$-attenuators. The resistor values for the attenuators were retrieved from an online calculator\footnote{$\Pi$\nd{}attenuator calculator \url{https://chemandy.com/calculators/matching-pi-attenuator-calculator.htm}}, and then simulated in LTSpice to verify the resulting properties.
 
@@ -254,7 +254,7 @@ By dividing the attenuators into two $\Pi$-networks, the series resistance requi
 
 When the ideal resistor values had been obtained, the power over time and maximum voltage for each resistor was obtained by simulation in a similar way as for the dummy load described in \autoref{sec:dummy_load:components}. Based on this, the minimum number of discrete resistors needed to withstand the pulse energy was calculated. The minimum number of series resistors to withstand the maximum pulse voltage was also obtained from the simulation.
 
-With the minimum number of discrete resistors needed for each ideal resistor known, a constellation of available resistor values was constructed to approximate the nominal value with as few resistors as possible. The circuits for the two attenuators are presented in \autoref{sec:result-attenuators}.
+With the minimum number of discrete resistors needed for each ideal resistor known, a constellation of available resistor values was designed to approximate the nominal value with as few resistors as possible. The circuits for the two attenuators are presented in \autoref{sec:result-attenuators}.
 
 When the number of resistors and their constellations was decided, all of the discrete ideal resistors were replaced with non-ideal models in the simulation software. Each lead inductance was set to \SI{1}{\nano\henry}, the internal inductance was set to \SI{0.1}{\nano\henry} and the internal capacitance was set to \SI{1}{\pico\farad}. Then the attenuators were checked in frequency domain, as well as how the pulses were affected in time domain. If the required \SI{400}{\mega\hertz} bandwidth could not be achieved, frequency compensation with capacitors was attempted.
 
@@ -275,7 +275,7 @@ The high voltage traces were placed on the top layer of the PCB, while all signa
     \captionsetup{width=.5\linewidth}
     \centering
     \includegraphics[width=0.5\textwidth]{relay_footprint}
-    \caption{Decorational circles were made on the relay footprint to mark the creepage and clearance distance required.}
+    \caption{Decorational circles were made on the relay footprint to mark the creepage and clearance distances required.}
     \label{fig:relay_footprint}
 \end{figure}
 
@@ -319,7 +319,7 @@ The signal was measured for each output terminal through each of the attenuators
 
 \begin{figure}
 	\includegraphics[width=0.4\textwidth]{relay_card_measurement_time}
-	\caption{The time measurement setup. Both the commercial and the constructed attenuators were measured in this setup.}
+	\caption{The time measurement setup. Both the commercially available and the designed attenuators were measured in this setup.}
 	\label{fig:relay_card_measurement_time}
 \end{figure}
 
@@ -327,7 +327,7 @@ A single relay was also measured using the network analyzer to get a perception
 
 To measure the test pulses through the attenuators, the switching fixture was connected to the CNA~200 and the pulses were measured on the intended connectors using an oscilloscope, as seen in \autoref{fig:relay_card_measurement_time}. The results were saved both as an image and as data points in a CSV\nd{}file, for further analysis.
 
-For comparison, the commercial attenuators were also measured in frequency domain with the ZVL and in time domain using the oscilloscope.
+For comparison, the commercially available attenuators were also measured in frequency domain with the ZVL and in time domain using the oscilloscope.
 
 
 \begin{figure}

rapport/results.tex

@@ -176,7 +176,7 @@ At first, the test equipment itself needed some care before it was possible to o
 The result from the initial measurements are presented, along with the limits, in \autoref{tab:initial_measurements} without the CNA~200 connected and in \autoref{tab:initial_measurements_cna} with the CNA~200 connected.
 
 \begin{table}[h]
-    \caption{The initial manual measurements, measured directly at each generator's output. Values highlighted in red are not within its specification.}
+    \caption{The initial manual measurements, measured directly at each generator's output. Values highlighted in red are not within their specifications.}
 \begin{adjustbox}{width=\columnwidth,center}
     %\centering
     \begin{tabular}{|l|r|r|r|r|r|r|} 
@@ -200,7 +200,7 @@ The result from the initial measurements are presented, along with the limits, i
 \end{table}
 
 \begin{table}[h]
-    \caption{The initial manual measurements on the equipment, including the CNA~200. Values highlighted in red are not within its specification.}
+    \caption{The initial manual measurements on the equipment, including the CNA~200. Values highlighted in red are not within their specifications.}
 \begin{adjustbox}{width=\columnwidth,center}
     %\centering
     \begin{tabular}{|l|r|r|r|r|r|r|} 
@@ -291,7 +291,7 @@ The LTO100 resistor series\footnote{\url{https://www.vishay.com/docs/50051/lto10
     \label{tab:dummy_load_energies}
 \end{table}
 
-When the least number of resistors required had been determined, some different resistor topologies were considered before setteling on the configuration seen in \autoref{fig:dummy_load_schematic}. The number of different resistor values was keept as low as considered possible to keep things easy.
+When the least number of resistors required had been determined, some different resistor topologies were considered before setteling on the configuration seen in \autoref{fig:dummy_load_schematic}. The number of different resistor values were kept as low as considered possible to keep things easy.
 
 \begin{figure}[H]
     %\captionsetup{width=.5\linewidth}
@@ -367,7 +367,7 @@ The resistance of the dummy loads are presented in \autoref{tab:four-wire-result
 
 %%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Design of the Switching Fixture and the Embedded Attenuators}
-The design of the switching fixture and its attenuators is described in this chapter. The constructed attenuator is reffered to as \emph{BK 50} and \emph{BK 1000} in the figures in this section to differentiate them from the commercial \emph{PAT 50} and \emph{PAT 1000}.
+The design of the switching fixture and its attenuators is described in this chapter. The designed attenuator is referred to as \emph{BK 50} and \emph{BK 1000} in the figures in this section to differentiate them from the commercially available \emph{PAT 50} and \emph{PAT 1000}.
 
 %%%%%%%%%%%%%%%%%%
 \subsection{Components}
@@ -380,7 +380,7 @@ The Panasonic's LF-G relays were chosen as switching elements as they have a hig
 %%%%%%%%%%%%%%%%%%
 \subsection{Attenuators}
 \label{sec:result-attenuators}
-The \SI{54.7}{\deci\bel} attenuator was divided into two \SI{27.35}{\deci\bel} $\Pi$\nd{}attenuator links. The values obtained from the online calculator was \SI{54.48}{\ohm} as the parallel resistors and \SI{581.62}{\ohm} as the series resistor for each link. The real value for the resistors, when replaced by several resistors connected in series and parallel, was chosen to \SI{54.67}{\ohm} and \SI{560}{\ohm} for parallel and series resistors respectively. The final attenuation was \SI{53.76}{\deci\bel} for the two links according to the simulation, as seen in \autoref{fig:ltspice-54db-attenuator}. The design was realized as seen in \autoref{fig:ltspice-54db-attenuator-comp}, with the number of resistors based on the maximum voltages and powers. Capacitors were placed in the schematic to allow for phase compensation.
+The \SI{54.7}{\deci\bel} attenuator was divided into two \SI{27.35}{\deci\bel} $\Pi$\nd{}attenuator links. The values obtained from the online calculator was \SI{54.48}{\ohm} as the parallel resistors and \SI{581.62}{\ohm} as the series resistor for each link. The real values for the resistors, when replaced by several resistors connected in series and parallel, was chosen to \SI{54.67}{\ohm} and \SI{560}{\ohm} for parallel and series resistors respectively. The final attenuation was \SI{53.76}{\deci\bel} for the two links according to the simulation, as seen in \autoref{fig:ltspice-54db-attenuator}. The design was realized as seen in \autoref{fig:ltspice-54db-attenuator-comp}, with the number of resistors based on the maximum voltages and powers. Capacitors were placed in the schematic to allow for phase compensation.
 
 Since the uncompensated simulated circuit had its \SI{3}{\deci\bel} limit at only \SI{190}{\mega\hertz} the circuit had to be compensated. The values used for compensating the circuit was \SI{130}{\pico\farad} for the first parallel resistance and \SI{10}{\pico\farad} for the second parallel link as seen in \autoref{fig:ltspice-54db-attenuator-comp}. The results before and after the compensation can be seen in \autoref{fig:50-ohm-result-response} where the new \SI{3}{\deci\bel} limit is instead over \SI{1}{\giga\hertz}.
 
@@ -469,7 +469,7 @@ Since the uncompensated circuit had its \SI{3}{\deci\bel} limit at only \SI{130}
 
 %%%%%%%%%%%%%%%%%%
 \subsection{PCB}
-The prototype and finished PCB can be seen side by side in \autoref{fig:attenuator-development}. The PCB had to be modified after it was delivered, since the creepage distance was to low in a few points and because the footprint for the relays was wrong. The modified PCB can be seen in \autoref{fig:attenuator-pcb}.
+The prototype and finished PCB can be seen side by side in \autoref{fig:attenuator-development}. The PCB had to be modified after it was delivered, since the creepage distance was to low at a few places and because the footprint for the relays was wrong. The modified PCB can be seen in \autoref{fig:attenuator-pcb}.
 
 The manufacturer's default values for dual layer boards was used for this PCB, i.e. \SI{18}{\micro\meter} copper layers on a \SI{1.6}{\milli\meter} laminate.
 
@@ -510,11 +510,11 @@ To attach the relay card fixture to the \SI{4}{\mm} banana connectors on the CNA
 
 %%%%%%%%%%%%%%%%%%
 \subsection{Measurements}
-Since the constructed attenuators were unstable already at about \SI{100}{\mega\hertz} the measurement sweep was only set to \SI{200}{\mega\hertz}.
+Since the designed attenuators deviated very much at frequencies above \SI{100}{\mega\hertz} the measurement sweep was only set to \SI{200}{\mega\hertz}.
 
-The constructed attenuators were not compensated, thus they are compared to the uncompensated simulated circuits. The frequency response for these are presented in \autoref{fig:50-ohm-comparison-result-response} and \autoref{fig:1k-ohm-comparison-result-response} for the \SI{50}{\ohm} and the \SI{1000}{\ohm} attenuator respectively.
+The designed attenuators were not compensated, thus they are compared to the uncompensated simulated circuits. The frequency response for these are presented in \autoref{fig:50-ohm-comparison-result-response} and \autoref{fig:1k-ohm-comparison-result-response} for the \SI{50}{\ohm} and the \SI{1000}{\ohm} attenuator respectively.
 
-A comparison to the commercial \emph{PAT 50} can be seen in \autoref{fig:50-ohm-real-vs-pat} and a comparison to the \emph{PAT 1000} can be seen in \autoref{fig:1k-ohm-real-vs-pat}.
+A comparison to the commercially available \emph{PAT 50} can be seen in \autoref{fig:50-ohm-real-vs-pat} and a comparison to the \emph{PAT 1000} can be seen in \autoref{fig:1k-ohm-real-vs-pat}.
 
 In \autoref{fig:bk50-signal-paths} and \autoref{fig:bk1000-signal-paths} the tree different signal paths are compared to each other to show the differences between them for the \SI{50}{\ohm} and the \SI{1000}{\ohm} attenuator respectively.
 
@@ -534,7 +534,7 @@ Any disconnected signal path should not affect the measured output. The results
 		\includegraphics[width=\textwidth]{simulated-vs-bk50-phase}
 	\end{subfigure}
 	
-	\caption{The simulated \SI{50}{\ohm} attenuator compared to the constructed.}
+	\caption{The simulated \SI{50}{\ohm} attenuator compared to the designed.}
 	\label{fig:50-ohm-comparison-result-response}
 \end{figure}
 	
@@ -552,14 +552,14 @@ Any disconnected signal path should not affect the measured output. The results
 		\includegraphics[width=\textwidth]{pat50-vs-bk50-phase}
 	\end{subfigure}
 	
-	\caption{The constructed \SI{50}{\ohm} attenuator compared to the commercial PAT 50.}
+	\caption{The designed \SI{50}{\ohm} attenuator compared to the commercially available PAT 50.}
 	\label{fig:50-ohm-real-vs-pat}
 \end{figure}
 
 \begin{figure}[h]
     \centering
     \includegraphics[width=0.8\textwidth]{bk50-paths}    
-    \caption{Comparison of the three different signal paths of the constructed \SI{50}{\ohm} attenuator.}
+    \caption{Comparison of the three different signal paths of the designed \SI{50}{\ohm} attenuator.}
     \label{fig:bk50-signal-paths}
 \end{figure}
 
@@ -584,7 +584,7 @@ Any disconnected signal path should not affect the measured output. The results
 		\includegraphics[width=\textwidth]{simulated-vs-bk1000-phase}
 	\end{subfigure}
 	
-	\caption{The simulated \SI{1000}{\ohm} attenuator compared to the constructed.}
+	\caption{The simulated \SI{1000}{\ohm} attenuator compared to the designed.}
 	\label{fig:1k-ohm-comparison-result-response}
 \end{figure}
 	
@@ -602,14 +602,14 @@ Any disconnected signal path should not affect the measured output. The results
 		\includegraphics[width=\textwidth]{pat1k-vs-bk1000-phase}
 	\end{subfigure}
 	
-	\caption{The constructed \SI{1000}{\ohm} attenuator compared to the commercial PAT 1000.}
+	\caption{The designed \SI{1000}{\ohm} attenuator compared to the commercially available PAT 1000.}
 	\label{fig:1k-ohm-real-vs-pat}
 \end{figure}
 
 \begin{figure}[h]
     \centering
     \includegraphics[width=0.8\textwidth]{bk1000-paths}    
-    \caption{Comparison of the three different signal paths of the constructed \SI{50}{\ohm} attenuator.}
+    \caption{Comparison of the three different signal paths of the designed \SI{50}{\ohm} attenuator.}
     \label{fig:bk1000-signal-paths}
 \end{figure}
 
@@ -626,12 +626,12 @@ The time measurements are shown in \autoref{fig:time-measurements}
 	\centering
 	\begin{subfigure}[t]{0.4\textwidth}
 		\includegraphics[width=\textwidth]{bk50_time}
-		\caption{The constructed \SI{50}{\ohm} attenuator}
+		\caption{The designed \SI{50}{\ohm} attenuator}
 		\label{fig:bk50-time}
 	\end{subfigure}\hfill
 	\begin{subfigure}[t]{0.4\textwidth}
 		\includegraphics[width=\textwidth]{bk1000_time}
-		\caption{The constructed \SI{1}{\kilo\ohm} attenuator}
+		\caption{The designed \SI{1}{\kilo\ohm} attenuator}
 		\label{fig:bk1000-time}
 	\end{subfigure}
 	

rapport/theory.tex

@@ -58,7 +58,7 @@ Part 1, \emph{Definitions and general considerations}, define abbreviations and
 
 Part 2, \emph{Electrical transient conduction along supply lines only}, defines the test procedures related to disturbances that are carried along the supply lines of a product. Both emission, disturbances created by the DUT, and immunity, the DUT's capability to withstand disturbances, are covered. This part defines the test pulses that are of interest for this project, and the verification of them. \cite{iso_7637_2}
 
-Part 3, \emph{Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines}, defines immunity tests against disturbances on other interfaces that the power supply. It focuses on test setups and different ways of coupling the signals. \cite{iso_7637_3}
+Part 3, \emph{Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines}, defines immunity tests against disturbances on other interfaces than the power supply. It focuses on test setups and different ways of coupling the signals. \cite{iso_7637_3}
 
 Part 5, \emph{Enhanced definitions and verification methods for harmonization of pulse generators according to ISO~7637}, proposes an alternative verification method of the test pulses defined in ISO~7637-2. The main difference from the method described in ISO~7637-2 is that the DC voltage, $U_A$, should not only be 0~V during the verification, but also be set to the nominal voltage, $U_N$. This will not be considered deeply in this report, since it is only a proposal and makes the verification equipment more difficult. \cite{iso_7637_5}
 
@@ -78,7 +78,7 @@ The general characteristics in common for all pulses are the DC voltage $U_A$, t
 	\centering
 	\begin{subfigure}[t]{0.45\textwidth}
 	    \includegraphics[width=\textwidth]{doubleexpfunc}
-	    \caption{The surge voltage $U_S$ is the puse maximum voltage disregarding the offset voltage $U_A$. The rise $t_r$ time is defined as the time elapsed from 0.1 to 0.9 times the surge voltage on the rising edge of the pulse. The duration $t_d$  is defined as the time from 0.1 times the maximum voltage on the rising edge, back to the same level of the falling edge.}
+	    \caption{The surge voltage $U_S$ is the pulse maximum voltage disregarding the offset voltage $U_A$. The rise $t_r$ time is defined as the time elapsed from 0.1 to 0.9 times the surge voltage on the rising edge of the pulse. The duration $t_d$  is defined as the time from 0.1 times the maximum voltage on the rising edge, back to the same level of the falling edge.}
    	    \label{fig:doubleexp}
 	\end{subfigure}\hfill
 	\begin{subfigure}[t]{0.45\textwidth}
@@ -99,7 +99,7 @@ During a test, the nominal voltage is first applied between the plus and minus t
     %\captionsetup{width=.5\linewidth}
     \centering
     \includegraphics[width=\textwidth]{test_equipment_setup}
-    \caption{Illustration of how the test equipment can apply a test pulse to the DUT whilst also providing the DC supply throuht an external PSU.}
+    \caption{Illustration of how the test equipment can apply a test pulse to the DUT whilst also providing the DC supply through an external PSU.}
     \label{fig:test_equipment_setup}
 \end{figure}
 
@@ -283,7 +283,7 @@ The verification is to be conducted with $U_A$ set to 0. There is, however, a pr
 
 The limits, and tolerances, for the pulses are summarised in \autoref{tab:verification-list}. The matched loads are to be within 1\% of the nominal value.
 
-The instruments used for measuring the pulses must have at least \SI{400}{\mega\hertz}, since pulse 3a and 3b contains frequency components of up to \SI{200}{\mega\hertz}. The measurement in open state for pulse 3a and 3b is a compromise, since a passive attenuator that does not load the input would be impossible to make, and was made as a 1000-ohm attenuator instead. This is how a similar generator is tested in another standard, the burst test in EN~61000\nd{}4\nd{}4. 
+The instruments used for measuring the pulses must have at least \SI{400}{\mega\hertz} bandwidth, since pulse 3a and 3b contains frequency components of up to \SI{200}{\mega\hertz}. The measurement in open state for pulse 3a and 3b is a compromise, since a passive attenuator that does not load the input would be impossible to make, and was made as a 1000-ohm attenuator instead. This is how a similar generator is tested in another standard, the burst test in EN~61000\nd{}4\nd{}4. 
 
 To put the problem with the high impedance attenuator in a comprehensible perspective, a short reasoning will follow. All real world circuits will have some capacitance and inductance. At \SI{400}{\mega\hertz} a \SI{1}{\pico\farad} would have an impedance of $\frac{1}{2*\pi*C*freq} \approx \SI{390}{\ohm}$. This would have a large influence on an attenuator with \SI{1000}{\ohm} input impedance.
 
@@ -320,7 +320,7 @@ To put the problem with the high impedance attenuator in a comprehensible perspe
 \section{Resistors at High Frequencies}
 \label{sec:theory:resistors_at_high_frequencies}
 
-When working with resistors at high frequencies, one must consider the parasitc properties of the resistor. Vishay presents a model which consists of the resistance $R$, internal inductance $L$, internal capacitance $C$, external lead inductance $L_C$ and external ground capacitance $C_G$. \cite{vishay_hf_resistor} Since the external ground capacitance is very small in comparison to the other parasitics, it has been neglected in this thesis. The model used for the simulations is depicted in \autoref{fig:nonIdealResistor}, with the values $L = \SI{0.1}{\nano\henry}$, $C = \SI{1}{\pico\farad}$ and $L_C = \SI{1}{\nano\henry}$. This is a bit higher than the values in Vishays paper, but those are also for smaller packages. An approximation of the combined inductance of more than \SI{1}{\nano\henry} for the 1206 SMD package is also in line with the values in a technical information note from AVX for capacitors, the package lead inductance should be similar for capacitors and resistors. \cite{avx_cap_parasitic}
+When working with resistors at high frequencies, one must consider the parasitic properties of the resistor. Vishay presents a model which consists of the resistance $R$, internal inductance $L$, internal capacitance $C$, external lead inductance $L_C$ and external ground capacitance $C_G$. \cite{vishay_hf_resistor} Since the external ground capacitance is very small in comparison to the other parasitics, it has been neglected in this thesis. The model used for the simulations is depicted in \autoref{fig:nonIdealResistor}, with the values $L = \SI{0.1}{\nano\henry}$, $C = \SI{1}{\pico\farad}$ and $L_C = \SI{1}{\nano\henry}$. This is a bit higher than the values in Vishays paper, but those are also for smaller packages. An approximation of the combined inductance of more than \SI{1}{\nano\henry} for the 1206 SMD package is also in line with the values in a technical information note from AVX for capacitors, the package lead inductance should be similar for capacitors and resistors. \cite{avx_cap_parasitic}
 
 \begin{figure}[H]
     \centering
@@ -548,13 +548,13 @@ The LD~200 is used to generate \emph{load dump test A}. LD is an abbreviation fo
 
 %%%%%%%%%%%%%%%%%%%
 \subsection{EM Test CNA 200 Coupling Network}
-The SNA~200 is a coupling network used to multiplex the pulse generators outputs. It contains several relays to select the appropriate generator output. The SNA~200 has one interface for each pulse generator, but no interface for a computer. It is automatically controlled by the pulse generators. This allows the DUT to be connected only to the CNA~200 and not to each individual pulse generator. \autoref{fig:test_setup_cna_dut} shows the connections between the instruments in this setup. There is also a coaxial connection for calibration of pulse 3a and pulse 3b on the front panel. The instrumentation panels can be seen in \autoref{fig:cna200}. The CNA~200 have no controls or manual settings since it is controlled by the test generators that are attached to it via DSUB-connectors.
+The CNA~200 is a coupling network used to multiplex the pulse generators outputs. It contains several relays to select the appropriate generator output. The CNA~200 has one interface for each pulse generator, but no interface for a computer. It is automatically controlled by the pulse generators. This allows the DUT to be connected only to the CNA~200 and not to each individual pulse generator. \autoref{fig:test_setup_cna_dut} shows the connections between the instruments in this setup. There is also a coaxial connection for calibration of pulse 3a and pulse 3b on the front panel. The instrumentation panels can be seen in \autoref{fig:cna200}. The CNA~200 have no controls or manual settings since it is controlled by the test generators that are attached to it via DSUB-connectors.
 
 \begin{figure}[H]
     %\captionsetup{width=.5\linewidth}
     \centering
     \includegraphics[width=0.5\textwidth]{test setup pulse injection}    
-    \caption{The CNA~200 allows each pusle generator to output their pulses through a common interface towards the DUT.}
+    \caption{The CNA~200 allows each pulse generator to output their pulses through a common interface towards the DUT.}
     \label{fig:test_setup_cna_dut}
 \end{figure}