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@@ -75,8 +75,7 @@ All test pulses defined in ISO~7637 and ISO~16750 are supposed to simulate event
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The test pulses of interest defined in ISO~7637 are denoted \emph{Test pulse 1}, \emph{Test pulse 2a}, \emph{Test pulse 3a} and \emph{Test pulse 3b}. The test pulse of interest defined in ISO~16750 is denoted \emph{Load dump Test A}. There are more pulses and tests defined in these standards, but those are not in the scope of this project.
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-The general characteristics in common for all pulses are the DC voltage $U_A$, the surge voltage $U_s$, the rise time $t_r$, the pulse duration $t_d$ and the internal resistance $R_i$. The internal resistance is only in series with the pulse generator, not the DC power source. For pulses that are supposed to be applied several times, $t_1$ usually denotes the time between the start of two consecutive pulses. The timings are illustrated in \autoref{fig:doubleexp}.
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-
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+The general characteristics in common for all pulses are the DC voltage $U_A$, the surge voltage $U_s$, the rise time $t_r$, the pulse duration $t_d$ and the internal resistance $R_i$. The property \emph{internal resistance} is only in series with the generated pulse, not in series with the DC power source. For pulses that are supposed to be applied several times, $t_1$ usually denotes the time between the start of two consecutive pulses. The timings are illustrated in \autoref{fig:doubleexp}.
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\begin{figure}[H]
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\centering
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@@ -90,16 +89,14 @@ The general characteristics in common for all pulses are the DC voltage $U_A$, t
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\caption{The repetition time is defined as the time between two adjacent rising edges.}
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\label{fig:doubleexprep}
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\end{subfigure}
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- \caption{The common properties of the pulses.}
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+ \caption{The common properties of the pulses, as defined by ISO~7637.}
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\end{figure}
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-An important observation is that the definition of the surge voltage, $U_s$, differs in ISO~7637 and ISO~16750 as depicted in \autoref{sec:us_difference}. \hl{In this report, only the definition from ISO~7637 is used.}
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-
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-\todo[Se till att fixa till referenserna här]
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-\todo[Bestäm mig ifall jag ska använda båda definitionerna av $U_S$ eller bara ena]
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+An important observation is that the definition of the surge voltage, $U_s$, differs in ISO~7637 and ISO~16750 as depicted in \autoref{fig:loadDumpTestA}.
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Test pulse 1}
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-This pulse simulates the event of the power supply being disconnected while the DUT is connected to other inductive loads. This leads to the other inductive loads generating a voltage transient of reversed polarity to the DUT's supply lines.
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+This pulse simulates the event of the power supply being disconnected while the DUT is connected to other inductive loads. The other inductive loads will generate a voltage transient of reversed polarity onto the DUT's supply lines.
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In the standard there are two additional timings associated to this pulse, $t_2$ and $t_3$, which are defining the disconnection time for the power supply during the voltage transient. In practice $t_3$ can be very short, specified to less than 100 µs, and the step seen in \autoref{fig:pulse1} might be too short to be clearly distinguishable when seen on a oscilloscope.
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@@ -138,6 +135,7 @@ In the standard there are two additional timings associated to this pulse, $t_2$
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\label{tab:pulse1}
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\end{table}
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Test pulse 2a}
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This pulse simulates the event of a load, parallel to the DUT, being disconnected. The inductance in the wiring harness will then generate a positive voltage transient on the DUT's supply lines. distinguishable when seen on a oscilloscope.
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@@ -172,6 +170,7 @@ This pulse simulates the event of a load, parallel to the DUT, being disconnecte
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\label{tab:pulse2a}
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\end{table}
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Test pulse 3a and 3b}
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Test pulse 3a and 3b simulates transients ``which occur as a result of the switching process'' as stated in the standard \cite{iso_7637_2}. The formulation is not very clear, but is interperted and explained by Frazier and Alles \cite{comparison_iso_7637_real_world} to be the result of a mechanical switch breaking an inductive load. These transients are very short, compared to the other pulses, and the repetition time is very short. The pulses are sent in bursts, grouping a number of pulses together and separating groups by a fixed time.
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@@ -223,6 +222,7 @@ These pulses contain high frequency components, up to 100~MHz, and special care
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\label{tab:pulse3}
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\end{table}
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Load dump Test A}
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The Load dump Test A simulates the event of disconnecting a battery that is charged by the vehicles alternator, the current that the alternator is driving will give rise to a long voltage transient.
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@@ -234,7 +234,7 @@ Prior to 2011, the Load dump Test A was part of the ISO~7637-2 standard under th
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%\captionsetup{width=.5\linewidth}
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\centering
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\includegraphics[width=\textwidth]{load dump a}
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- \caption{Illustration of load dump Test A. Note the difference of $U_S$ compared to all the other pulses. To minimize the risk of misunderstandings, only the way of specifying $U_S$ as the other pulses do will be used unless otherwise stated.}
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+ \caption{Illustration of load dump Test A. Note the different definition of $U_S$ compared to the other pulses.}
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\label{fig:loadDumpTestA}
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\end{figure}
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@@ -261,14 +261,25 @@ Prior to 2011, the Load dump Test A was part of the ISO~7637-2 standard under th
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\label{tab:loadDumpTestA}
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\end{table}
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-\subsection{Test setup}
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-During a test, the nominal voltage is first applied between the plus and minus terminal of the DUT's power supply input. Then a series of test pulses are applied between the same terminals. The pulses are repeated at specified intervals, $t_1$, as depicted in \autoref{fig:doubleexprep}.
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-\todo[Snygg bild på uppkoppling och kopplingsnätverk.].
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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+\subsection{Application of test pulses}
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+During a test, the nominal voltage is first applied between the plus and minus terminal of the DUT's power supply input by the test equipment. Then a series of test pulses are applied between the same terminals. The pulses are repeated at specified intervals, $t_1$, as depicted in \autoref{fig:doubleexprep}.
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+
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+An example of how a test pulse can be applied by the test equipment is depicted in \autoref{fig:test_equipment_setup}.
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+
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+\begin{figure}[H]
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+ %\captionsetup{width=.5\linewidth}
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+ \centering
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+ \includegraphics[width=\textwidth]{test_equipment_setup}
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+ \caption{Illustration of how the test equipment can apply a test pulse to the DUT whilst also providing the DC supply throuht an external PSU.}
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+ \label{fig:test_equipment_setup}
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+\end{figure}
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Verification}
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The test pulses are to be verified before they are applied to the DUT. The voltage levels and the timings are to be measured both without any load, and with a matched load, $R_L$ = $R_i$, attached. The standard omits the rise time constraint when the load is attached, except for pulse 3a and 3b. \cite{iso_7637_2}
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-The verification is to be conducted with $U_A$ set to 0. There is, however, a proposal to set $U_A$ to the actual nominal voltage during the verification process, as the behaviour of the pulse generators has proven differ in this case \cite{iso_7637_5}. In this project $U_A = 0$ will be used.
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+The verification is to be conducted with $U_A$ set to 0. There is, however, a proposal to set $U_A$ equal to the nominal voltage during the verification process, as the behaviour of the pulse generators has proven differ in this case \cite{iso_7637_5}. In this project $U_A = 0$ will be used.
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The limits, and tolerances, for the pulses are summarised in \autoref{tab:verification-list}. The matched loads are to be within 1\% of the nominal value. \cite{iso_7637_2}
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@@ -279,137 +290,28 @@ The limits, and tolerances, for the pulses are summarised in \autoref{tab:verifi
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\begin{tabular}{|l|r|r|r|r|}
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\hline
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& & \multicolumn{3}{c|}{Limits}\\
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- Pulse & Match resistor (\si{\ohm}) & $U_S$ (\si{\volt}) & $t_d$ (\si{\second}) & $t_r$ (\si{\second}) \\
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- \hline
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- Pulse 1, 12 V, Open & & $[ -110, -90 ]$ & \SIrange{1.6}{2.4}{\milli\second} $[1.6,2.4]$ \si{\milli} & $[0.5,1]$ \si{\micro} \\
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- Pulse 1, 12 V, Matched & 10 & $[ -110, -90 ]$ & $[1.6,2.4]$ \si{\milli} & $[0.5,1]$ \si{\micro} \\
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- Pulse 1, 24 V, Open & & $[ -660, -540 ]$ & $[0.8,1.2]$ \si{\milli} & $[1.5,3]$ \si{\micro} \\
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- Pulse 1, 24 V, Matched & 50 & $[ -660, -540 ]$ & $[0.8,1.2]$ \si{\milli} & $[1.5,3]$ \si{\micro} \\
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- Pulse 2a, Open & & $[ 67.5, 82.5 ]$ & $[40,60]$ \si{\micro} & $[0.5,1]$ \si{\micro} \\
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- Pulse 2a, Matched & 2 & $[ 67.5, 82.5 ]$ & $[40,60]$ \si{\micro} & $[0.5,1]$ \si{\micro} \\
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- Pulse 3a, Open (1k) & & $[ -220, -180 ]$ & $[105,195]$ \si{\nano} & $[3.5,6.5]$ \si{\nano} \\
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- Pulse 3a, Match & 50 & $[ -120, -80 ]$ & $[105,195]$ \si{\nano} & $[3.5,6.5]$ \si{\nano} \\
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- Pulse 3b, Open (1k) & & $[ 180, 220 ]$ & $[105,195]$ \si{\nano} & $[3.5,6.5]$ \si{\nano} \\
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- Pulse 3b, Match & 50 & $[ 80, 120 ]$ & $[105,195]$ \si{\nano} & $[3.5,6.5]$ \si{\nano} \\
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- Load dump A, 12 V, Open & & $[ 90, 110 ]$ & $[320,480]$ \si{\milli} & $[5,10]$ \si{\milli} \\
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- Load dump A, 12 V, Matched & 2 & $[ 90, 110 ]$ & $[320,480]$ \si{\milli} & $[5,10]$ \si{\milli} \\
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- Load dump A, 24 V, Open & & $[ 180, 220 ]$ & $[280,420]$ \si{\milli} & $[5,10]$ \si{\milli} \\
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- Load dump A, 24 V, Matched & 2 & $[ 180, 220 ]$ & $[280,420]$ \si{\milli} & $[5,10]$ \si{\milli} \\
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+ Pulse & Match resistor & $U_S$ & $t_d$ & $t_r$ \\
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+ \hline
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+ Pulse 1, 12 V, Open & & \SIrange{-110}{ -90}{\volt} & \SIrange{1.6}{2.4}{\milli\second} & \SIrange{0.5}{ 1}{\micro\second} \\
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+ Pulse 1, 12 V, Matched & 10 \si{\ohm} & \SIrange{-110}{ -90}{\volt} & \SIrange{1.6}{2.4}{\milli\second} & \SIrange{0.5}{ 1}{\micro\second} \\
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+ Pulse 1, 24 V, Open & & \SIrange{-660}{-540}{\volt} & \SIrange{0.8}{1.2}{\milli\second} & \SIrange{1.5}{ 3}{\micro\second} \\
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+ Pulse 1, 24 V, Matched & 50 \si{\ohm} & \SIrange{-660}{-540}{\volt} & \SIrange{0.8}{1.2}{\milli\second} & \SIrange{1.5}{ 3}{\micro\second} \\
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+ Pulse 2a, Open & & \SIrange{67.5}{82.5}{\volt} & \SIrange{ 40}{ 60}{\micro\second} & \SIrange{0.5}{ 1}{\micro\second} \\
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+ Pulse 2a, Matched & 2 \si{\ohm} & \SIrange{67.5}{82.5}{\volt} & \SIrange{ 40}{ 60}{\micro\second} & \SIrange{0.5}{ 1}{\micro\second} \\
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+ Pulse 3a, Open (1k) & & \SIrange{-220}{-180}{\volt} & \SIrange{105}{195}{\nano\second} & \SIrange{3.5}{6.5}{\nano\second} \\
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+ Pulse 3a, Match & 50 \si{\ohm} & \SIrange{-120}{ -80}{\volt} & \SIrange{105}{195}{\nano\second} & \SIrange{3.5}{6.5}{\nano\second} \\
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+ Pulse 3b, Open (1k) & & \SIrange{ 180}{ 220}{\volt} & \SIrange{105}{195}{\nano\second} & \SIrange{3.5}{6.5}{\nano\second} \\
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+ Pulse 3b, Match & 50 \si{\ohm} & \SIrange{ 80}{ 120}{\volt} & \SIrange{105}{195}{\nano\second} & \SIrange{3.5}{6.5}{\nano\second} \\
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+ Load dump A, 12 V, Open & & \SIrange{ 90}{ 110}{\volt} & \SIrange{320}{480}{\milli\second} & \SIrange{ 5}{ 10}{\milli\second} \\
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+ Load dump A, 12 V, Matched & 2 \si{\ohm} & \SIrange{ 90}{ 110}{\volt} & \SIrange{320}{480}{\milli\second} & \SIrange{ 5}{ 10}{\milli\second} \\
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+ Load dump A, 24 V, Open & & \SIrange{ 180}{ 220}{\volt} & \SIrange{280}{420}{\milli\second} & \SIrange{ 5}{ 10}{\milli\second} \\
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+ Load dump A, 24 V, Matched & 2 \si{\ohm} & \SIrange{ 180}{ 220}{\volt} & \SIrange{280}{420}{\milli\second} & \SIrange{ 5}{ 10}{\milli\second} \\
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\hline
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\end{tabular}
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\end{adjustbox}
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\label{tab:verification-list}
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\end{table}
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-%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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-\section{Differences between the new and the old standard}
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-Since the equipment used the project is designed for the older version of the standard, ISO~7637\nd2:2004 and possibly even ISO~7637\nd1:1990 together with ISO~7637\nd2:1990, the differences of importance between these will be presented in this chapter to see what parameters might be a problem for the older equipment to fulfil.
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-
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-One of the most notable differences is the removal of a test pulse from ISO~7637\nd2 that was called \emph{Pulse 5a}, this was instead introduced to the ISO~16750\nd2 under the name \emph{Load dump A}.
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-
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-\subsection{Supply voltage}
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-The definition of the DC supply voltage for the DUT differs in some case between the older and the newer versions of the standard. There are two different supply voltage definitions. $U_A$ represents a system where the generator is in operation and $U_B$ represents the system without the generator in operation. These have different values for \SI{12}{\volt} and \SI{24}{\volt} systems. $U_B$ is only relevant for Load dump Test A and is thus not defined in ISO~7637 anymore.
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-
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-In the older ISO~7637 the definitions could be found in part 2 in clause 4.2. In the newer version these were moved to part 1, clause 5.3. The definition of $U_B$ was moved to ISO~16750\nd1: \hl{SE TILL ATT KOLLA I VILKA KAPITEL I VILKA STANDARDER SAKERNA STÅR NÅGONSTANS}
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-
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-\begin{table}[H]
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- \caption{Comparison of the different supply voltage definitions.}
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-\begin{adjustbox}{width=\columnwidth,center}
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- %\centering
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- \begin{tabular}{|l|l|r|r|r|}
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- \hline
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- & & \multicolumn{3}{c|}{Supply voltage range} \\
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- Parameter & $U_N$ & ISO 7637-2:2004 & ISO 7637-1:2015 & ISO 16750-1:2018 \\
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- \hline
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- $U_A$ & \SI{12}{\volt} & \SIrange{13}{14}{\volt} & \SIrange{12}{13}{\volt} & \SIrange{13.8}{14.2}{\volt} \\
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- $U_A$ & \SI{24}{\volt} & \SIrange{26}{28}{\volt} & \SIrange{24}{28}{\volt} & \SIrange{27.8}{28.2}{\volt} \\
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- \hline
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- $U_B$ & \SI{12}{\volt} & \SIrange{12.3}{12.7}{\volt} & - & \SIrange{12.3}{12.7}{\volt} \\
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- $U_B$ & \SI{24}{\volt} & \SIrange{23.6}{24.4}{\volt} & - & \SIrange{23.8}{24.2}{\volt} \\
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- \hline
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- \end{tabular}
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-\end{adjustbox}
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- \label{tab:supplyVoltageDiff}
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-\end{table}
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-
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-\subsection{Definitions}
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-ISO~7637 and ISO~16750
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-
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-The definitions are stated in the first part of the standards, ISO~7637-1 and ISO~16750-1.
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-
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-
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-\todo[Snygga till presentationen av definitionerna]
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-
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-\bm{$U_S$}
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-
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-For pulse 1, 2a, 3a and 3b: $U_{TOP} - U_N$
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-
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-For Load dump A: $U_{TOP}$
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-
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-
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-\bm{$U_A$}
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-
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-For pulse 1, 2a, 3a and 3b: $13.5 \pm 0.5$ V, $27 \pm 1$ V \cite{iso-7637-}
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-
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-For Load dump A: $14 \pm 0.2$ V, $28 \pm 0.2$ V \cite{iso-16750-1}
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-
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-
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-\subsection{Tolerances}
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-Some of the allowed ranges on the pulses parameters has changed compared to the older version of the standard.
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-
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-\todo[Gör snygga tabeller]
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-
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-\textbf{Pulse 1}
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-Old, 12V: $U_S -75 -- -100$ V
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-Old, 24V: $U_S -450 -- -600$ V
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-
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-New, 12V: $U_S -75 -- -150$ V
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-New, 24V: $U_S -300 -- -600$ V
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-
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-\textbf{Pulse 2a}
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-Old: $U_S 37 -- 50$ V
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-
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-New: $U_S 37 -- 112$ V
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-
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-\textbf{Pulse 3a and Pulse 3b}
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-Old, 12V: $\lvert U_S \rvert 112 -- 150$ V
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-Old, 24V: $\lvert U_S \rvert 150 -- 200$ V
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-
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-New, 12V: $\lvert U_S \rvert 112 -- 220$ V
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-New, 24V: $\lvert U_S \rvert 150 -- 300$ V
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-
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-Old: $t_r 100 -- 200$ µs
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-
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-New: $t_r 105 -- 195$ µs
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-
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-\textbf{Load dump A}
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-No change, other that the definitions.
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-
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-\subsection{Tolerances for verification}
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-\textbf{Pulse 1}
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-
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-Old, 24V, matched: $U_S -300 \pm 30$ V
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-
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-New, 24V, matched: $U_S -300 \pm 60$ V
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-
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-\textbf{Pulse 2a}
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-
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-Old, open: $U_S 50 \pm 5$ V, matched $U_S 25 \pm 5$ V
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-
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-New, open: $U_S 75 \pm 7.5$ V, matched $U_S 35.5 \pm 7.5$ V
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-
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-\textbf{Pulse 3a and Pulse 3b}
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-
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-No change.
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-
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-\textbf{Load dump A}
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-
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-No change.
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-
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-
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-\subsection{Summary of critical changes}
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-
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-\hl{Fyll i de förändringar som gör sakerna striktare}
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\section{Resistors at high frequencies}
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@@ -438,21 +340,24 @@ Chapter 3.1.6 \cite{theCircuitDesignersCompanion}
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\section{Measurement}
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There are several measurement methods needed during the project. To verify the test pulses, voltage has to be measured over time. To verify the dummy loads, resistance has to be measured. To verify the attenuators, their magnitude response has to be measured. This chapter describes the necessary measurement theory required for this project.
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Resistance}
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To measure resistance, a current is fed through the resistor and the resulting voltage is measured to calculate the resistance using ohms law. This is typically carried out using a multimeter and two probe wires connecting to each terminal of the resistor. When measuring very low valued resistors, however, the resistance in the probe wires can be significant in relation to the resistor measured and will affect the accuracy. One way of overcoming this is to perform a 4-wire measurement using a so called \emph{Kelvin connection}. In this method the current that is fed through the resistor using one pair of wire, and the resulting voltage is measured at the desired point using another pair according to \autoref{fig:kelvin_measurement}.\cite{theCircuitDesignersCompanion}
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-\begin{figure}
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+\begin{figure}[H]
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%\captionsetup{width=.5\linewidth}
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\includegraphics[width=0.5\textwidth]{kelvin_measurement}
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\caption{When measuring a low value resistor, the \emph{Kelvin connection} can be used to determine the resistance at the point where the voltmeter is connected without the resistance in the probe leads affecting the result.}
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\label{fig:kelvin_measurement}
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\end{figure}
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{High Voltage}
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The highest voltage that can be generated by the pulse generators is 1500~V, which is higher than any of the standards require but will serve as the design goal for the verification equipment. This is a higher voltage than most acquisition devices can measure without the use of external attenuators \cite{source}.
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Resistive attenuators.. \todo[fyll på]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Oscilloscopes, bandwidth, rise time and probes}
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When using an oscilloscope to measure voltage over time, there are several limiting factors to how fast signals one can measure. The oscilloscope itself has a specified bandwidth, as do the probe and any attenuators used. All of these combined determine how short rise times that can be measured accurately. The rise time of the measured will be affected by these properties and the rise time displayed on the oscilloscope screen will be approximately according to \autoref{equ:riseComposite}, where $T_N$ is the \SIrange{10}{90}{\percent} rise time limit for each part in the chain. \cite{highSpeedDigitalDesign}
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@@ -468,20 +373,24 @@ Since \autoref{equ:riseComposite} is based on the rise time limitation but the s
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T_{10-90} = \frac{0.338}{F_{ \SI{3}{\deci\bel}}}
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\end{equation}
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Measurement errors}
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\todo[Put good theory here]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{RF Attenuators}
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Linearity, tolerances, power, combinations of resistors, impedances
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Tolerances and maximum ratings}
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Resistors, Power, Voltages, surges,
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Relays, isolation, dielectric strength
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%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\section{Analysis}
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-The data points from the measurement must be processed and evaluated to determine if the measured pulse is within the specified limits. There are several techniques to accomplish this, which have different advantages.\cite{source}
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+The data points from the measurement must be processed and evaluated to determine if the measured pulse is within the specified limits.
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Mathematical description}
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All of the test pulses applied to the vehicle equipment can individually be described mathematically by variations of the double exponential function shown in \autoref{eq:doubleexp} and \autoref{fig:doubleexp}. The properties of interest, the ones which are specified in the standards, are the surge voltage $ U_s $, the rise time $ t_r $, the duration $ t_d $ and the repetition time $ t_1 $. \cite{iso_7637_2}
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@@ -490,19 +399,24 @@ All of the test pulses applied to the vehicle equipment can individually be desc
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\label{eq:doubleexp}
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\end{equation}
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{What is good}
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\label{sec:goodness}
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\todo[Någonting om vad som anses bra]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Curve fitting?}
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\todo[Läs på om ämnet och se ifall det kan vara rimligt]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Max/min limits?}
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\todo[Användandet av max/min-fönster]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Parameter extraction?}
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\todo[Detta är nog ett påhittat ord, kanske menar jag curve fitting?]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Evaluation/simulation/robustness}
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\todo[Jämför och evaluera de två eller tre metoderna med hänseende till vad som står i ``goodness'']
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@@ -561,42 +475,49 @@ On the Design and Generation of the Double Exponential Function S. C. Dutta
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\section{Instrumentation and control}
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The following chapter describes the different instruments that were used, and their control interfaces.
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{GPIB}
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IEEE-488, or GPIB which it is often called, is a parallel bus interface. It is mainly used to interconnect lab instrumentation such as multimeters, signal generators and spectrum analyzers.
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\todo[fyll på och hitta källor, lägg in bild på interface]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Tektronix TDS7104 Oscilloscope}
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The oscilloscope that is available is a Tektronix TDS7104, with specifications as seen in \autoref{tab:tds7104}. It has GPIB interface and TekVISA GPIB, an API for sending GPIB commands over ethernet, available for remote control.
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\todo[Lägg in bild på utrustning, och tabell med data]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{EM Test MPG 200 Micropulse generator}
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The MPG~200 is used to generate \emph{Test pulse 1} and \emph{2a}. MPG is an abbreviation for \emph{MicroPulse Generator}. The instrument is designed to generate test pulses according to the older ISO~7637-2:1990 version, but the parameters can be adjusted to comply with the new ISO~7637:1990 standard.
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\todo[Lägg in bild på utrustning, och tabell med data]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{EM Test EFT 200 Burst generator}
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The EFT~200 is used to generate \emph{Test pulse 3a} and \emph{3b}. EFT is an abbreviation for \emph{Electrical Fast Transient}. The instrument is designed to generate test pulses according to the older ISO~7637-2:1990 version, but the parameters can be adjusted to comply with the new ISO~7637:1990 standard.
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\todo[Lägg in bild på utrustning, och tabell med data]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{EM Test LD 200 Load dump}
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The LD~200 is used to generate \emph{Load dump Test A}. LD is an abbreviation for \emph{Load Dump}. The instrument is designed to generate test pulses according to the older ISO~7637-2:1990 version, but the parameters can be adjusted to comply with the new ISO~16750:2012 standard.
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\todo[Lägg in bild på utrustning, och tabell med data]
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-
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{EM Test CNA 200 Coupling Network}
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The SNA~200 is a coupling network, used to multiplex the pulse generators into one box. It contains several relays to select the appropriate generator output. The SNA~200 has one interface for each pulse generator, but no interface for a computer. It is automatically controlled by the pulse generators.
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\todo[Lägg in bild på utrustning, och tabell med data]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{Rohde \& Schwarz ZVL13}
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\label{sec:rohde_schwarz_zvl}
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The ZVL13 is a vector network analyzer. It is, in this project, used to measure the magnitude and phase response between its two ports.
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\todo[Lägg in bild på utrustning, och tabell med data]
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+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
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\subsection{PAT 50 and PAT 1000}
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\label{theory_pat_attenuators}
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Jonatan Gezelius
