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rapport/method.tex

@@ -34,6 +34,7 @@
 \chapter{Methods}\label{cha:methods}
 This chapter covers the methodologies used during the project.
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Prestudy}
 During the project efforts were made to find relevant research using Linköping University Library's\footnote{\url{https://liu.se/en/library}} and Google Scholar's\footnote{\url{https://scholar.google.se/}} search engines. Among the keywords used in searching were;
 
@@ -66,18 +67,18 @@ In either case, the following tasks should be considered if there is time:
     \item Evaluate these methods.
 \end{enumerate}
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Examination and initial measurement of the old equipment}
-\hl{Peta in här någonstans att det var lite krångel att få fart på utrustningen och att det behövdes en del felsökning?}
-
 To decide the forthcoming of the project, the equipment first had to be checked to see if its performance were within the limits for use with the newer standard. Because there is no dummy loads available at this point of the project, only open load measurements could be done.
 
 With exception for Pulse 3a and Pulse 3b, all of the pulses were measured with the use of the high voltage differential probe described in \autoref{sec:hv-diff-probe}. The pulses are measured both directly on each generator connected according to \autoref{fig:manual-measurement-hv-diff} and also through the coupling network CNA~200, as depicted in \autoref{fig:manual-measurement-hv-diff-cna}. 
 \todo[figure of connection]
-Pulse 3a and Pulse 3b was measured using the attenuators described in \autoref{sec:hv-attenuators} connected according to \autoref{fig:manual-measurement-hv-att}. Thanks to the 50-ohm attenuator this pulse could be measured in its matched state. The measurement in open state is a compromise, since there was no such attenuator available, and was made into a 1000-ohm attenuator instead.
+Pulse 3a and Pulse 3b was measured using the attenuators described in \autoref{sec:hv-attenuators} connected according to \autoref{fig:manual-measurement-hv-att}. Thanks to the 50-ohm attenuator this pulse could be measured in its matched state. The measurement in open state is a compromise, since a passive attenuator that does not load the input would be impossible to make, and was made as a 1000-ohm attenuator instead.
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Test architecture}
 \squareit{Alternatives and choices. Try finding articles on human error maybe. Make plenty of nice figures.}
-The total number of tests needed to verify the testing equipment before each product test is 14, according to \autoref{tab:verification-list}. There are in total three different values for dummy loads, in practice these will be represented by three different high power dummy loads and two high frequency attenuators for pulse 3a and pulse 3b.
+The total number of tests needed to verify the testing equipment before each product test is 14, according to \autoref{tab:verification-list}. There are in total three different values for dummy loads. In practice these could be represented by two high frequency attenuators for pulse 3a and pulse 3b, since these have really short rise times that will be affected much by parasitics of components, and three different high power dummy loads for the slower pulses where the parasitic effects might be negligible but the withstand power must be higher.
 
 The following test architectures were considered, together with the external supervisor at the company.
 
@@ -118,6 +119,7 @@ The advantage of this, on top of the advantages of alternative 2, is that there
 
 The disadvantage of this would be that the embedded attenuators might prove difficult to design. They need to be accurate up to high frequencies, be tolerable to high voltage, dissipate the power necessary and also be electrically safe.
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Design of dummy loads}
 Each dummy load must withstand the applied test pulses, and preferably the worst possible test pulse for the specific dummy load even though it might not be intended. The dummy loads must have a tolerance of \SI{1}{\percent} or less and be non-inductive. \cite{iso_7637_2}
 
@@ -172,7 +174,7 @@ When the PCB was delivered, it was visually inspected before assembling. Some mo
 \subsection{Measurement}
 When the dummy loads had been assembled, their resistances were determined using four wire resistance measurement directly at the PCB's connection points, as seen in \autoref{fig:four-wire-measurement}. With this technique, one can neglect the resistance in the cables used for measuring which can have a significant affect when measuring low resistance loads \cite{book:measurment-techniques}.
 
-
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Design of the switching fixture and the embedded attenuators}
 The chosen implementation requires a fixture that switches and attenuators, which purpose is to switch the pulse to the desired attenuator or to the dummy load. It must be able to handle the momentary pulse energies and voltages and should not distort the pulse.
 

rapport/results.tex

@@ -36,9 +36,10 @@
 \section{Prestudy}
 Since not much was known about the project at this time, it was difficult to find relevant papers on the topic of the standards.  Most of the literature was found during the project as new problems was found along the way.
 
-
 \section{Initial measurement of the old equipment}
 
+\hl{Peta in här någonstans att det var lite krångel att få fart på utrustningen och att det behövdes en del felsökning?}
+
 The result from the initial measurements are presented, along with the limits, in \autoref{tab:initial_measurements} without the CNA~200 connected and in \autoref{tab:initial_measurements_cna} with the CNA~200 connected.
 
 \begin{table}[h]

rapport/theory.tex

@@ -36,9 +36,11 @@
 
 This chapter introduces the theory and facts that are related to this project. It describes the necessary parts of the ISO standards, measurement theory and methods to analyse  acquired data.
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Previous research}
 No previous research directly relevant to the reuse of test equipment was found. Though research that has been made on topics relevant to project, such as measurement techniques and curve fitting, are presented in this theory chapter.
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{ISO standards}
 The ISO organisation, International Organization for Standardization, was founded in 1947 and has since published more than 22,500 International Standards. ISO standards does not only cover the electronic industry, but almost every industry. The purpose of the standards is to ensure safety, reliability and quality of products in a unified way, making international trade easier. The name ISO comes from the Greek word \emph{isos}, which means \emph{equal}.
 \cite{site:iso_about}
@@ -49,6 +51,7 @@ The naming convention used for ISO standards is in the format \emph{number-part:
 
 To get hold of a copy of a standard, one need to buy it from ISO store or from a national ISO member. \cite{site:iso_shopping_faqs}
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{ISO~7637 and ISO~16750}
 
 \textbf{The ISO~7637 standard}, \emph{Road vehicles — Electrical disturbances from
@@ -65,16 +68,17 @@ Part 5, \emph{Enhanced definitions and verification methods for harmonization of
 The ISO~16750, \emph{Road vehicles -- Environmental conditions and testing for electrical and electronic equipment}, concerns different environmental factors that a product might face in a vehicle, such as mechanical shocks, temperature changes and acids. Part 2 of the standard, \emph{Electrical Loads}, deals with some electrical aspects that was previously part of the ISO~7637 standard. This is the only part of ISO~16750 that will be considered.
 \cite{iso_16750_1, iso_16750_2}
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Test pulses}
 
 All test pulses defined in ISO~7637 and ISO~16750 are supposed to simulate events that can occur in a real vehicle's electrical environment, that equipment must be able to withstand. The properties of these test pulses are well defined, to allow for unified testing regardless of which test lab that performs the test. In the real world, however, the disturbances might of course differ from the test pulses since a real case environment is not controlled. \cite{iso_7637_2,iso_16750_2, comparison_iso_7637_real_world}
 
 The test pulses of interest defined in ISO~7637 are denoted \emph{Test pulse 1}, \emph{Test pulse 2a}, \emph{Test pulse 3a} and \emph{Test pulse 3b}. The test pulse of interest defined in ISO~16750 is denoted \emph{Load dump Test A}. There are more pulses and tests defined in these standards, but those are not in the scope of this project.
 
-The general characteristics in common for all pulses are the DC voltage $U_A$, the surge voltage $U_s$, the rise time $t_r$, the pulse duration $t_d$ and the internal resistance $R_i$. The internal resistance is only in series with the pulse generator, not the DC power source. For pulses that are supposed to be applied several times, $t_1$ usually denotes the time between the start of two consecutive pulses. The timings are illustrated in  \autoref{doubleexpfunc}.
+The general characteristics in common for all pulses are the DC voltage $U_A$, the surge voltage $U_s$, the rise time $t_r$, the pulse duration $t_d$ and the internal resistance $R_i$. The internal resistance is only in series with the pulse generator, not the DC power source. For pulses that are supposed to be applied several times, $t_1$ usually denotes the time between the start of two consecutive pulses. The timings are illustrated in  \autoref{fig:doubleexp}.
 
 
-\begin{figure}[h]
+\begin{figure}[H]
 	\centering
 	\begin{subfigure}[t]{0.45\textwidth}
 	    \includegraphics[width=\textwidth]{doubleexpfunc}
@@ -99,7 +103,7 @@ This pulse simulates the event of the power supply being disconnected while the
 
 In the standard there are two additional timings associated to this pulse, $t_2$ and $t_3$, which are defining the disconnection time for the power supply during the voltage transient. In practice $t_3$ can be very short, specified to less than 100 µs, and the step seen in \autoref{fig:pulse1} might be too short to be clearly distinguishable when seen on a oscilloscope.
 
-\begin{figure}[h]
+\begin{figure}[H]
     %\captionsetup{width=.5\linewidth}
     \centering
     \includegraphics[width=\textwidth]{pulse1}    
@@ -107,7 +111,7 @@ In the standard there are two additional timings associated to this pulse, $t_2$
     \label{fig:pulse1}
 \end{figure}
 
-\begin{table}[h]
+\begin{table}[H]
     \centering
     \caption{Parameter values for pulse 1}
     \begin{tabularx}{0.7\textwidth}{|X|c|c|}
@@ -139,7 +143,7 @@ In the standard there are two additional timings associated to this pulse, $t_2$
 \subsection{Test pulse 2a}
 This pulse simulates the event of a load, parallel to the DUT, being disconnected. The inductance in the wiring harness will then generate a positive voltage transient on the DUT's supply lines. distinguishable when seen on a oscilloscope.
 
-\begin{figure}[h]
+\begin{figure}[H]
     %\captionsetup{width=.5\linewidth}
     \centering
     \includegraphics[width=\textwidth]{pulse2a}    
@@ -147,7 +151,7 @@ This pulse simulates the event of a load, parallel to the DUT, being disconnecte
     \label{fig:pulse2a}
 \end{figure}
 
-\begin{table}[h]
+\begin{table}[H]
     \centering
     \caption{Parameter values for pulse 2a}
     \begin{tabularx}{0.7\textwidth}{|X|c|c|}
@@ -178,7 +182,7 @@ Test pulse 3a and 3b simulates transients ``which occur as a result of the switc
 These pulses contain high frequency components, up to 100~MHz, and special care must be taken when running tests with them as well as when verifying them.
 
 
-\begin{figure}[h]
+\begin{figure}[H]
 	\centering
 	\begin{subfigure}[t]{0.45\textwidth}
 	    \includegraphics[width=\textwidth]{pulse3a}
@@ -194,7 +198,7 @@ These pulses contain high frequency components, up to 100~MHz, and special care
 	\label{fig:pulse3}
 \end{figure}
 
-\begin{table}[h]
+\begin{table}[H]
     \centering
     \caption{Parameter values for pulse 3a and 3b}
     \begin{tabularx}{0.7\textwidth}{|X|c|c|}
@@ -232,7 +236,7 @@ This pulse has the longest duration, $t_d$, of all the test pulses. It also has
 
 Prior to 2011, the Load dump Test A was part of the ISO~7637-2 standard under the name \emph{Test pulse 5a}. The surge voltage $U_s$ was in the older standard, \mbox{ISO~7637-2:2004}, defined as the voltage between the DC offset voltage $U_A$ and the maximum voltage. In the newer standard, \mbox{ISO~16750-2:2012}, $U_s$ is defined as the absolute peak voltage. Only the former definition is used in this paper, $U_s = \hat{U} - U_A$.
 
-\begin{figure}[h]
+\begin{figure}[H]
     %\captionsetup{width=.5\linewidth}
     \centering
     \includegraphics[width=\textwidth]{load dump a}
@@ -240,7 +244,7 @@ Prior to 2011, the Load dump Test A was part of the ISO~7637-2 standard under th
     \label{fig:loadDumpTestA}
 \end{figure}
 
-\begin{table}[h]
+\begin{table}[H]
     \centering
     \caption{Parameter values for load dump Test A}
     \begin{tabularx}{0.7\textwidth}{|X|c|c|}
@@ -270,13 +274,13 @@ During a test, the nominal voltage is first applied between the plus and minus t
 \todo[Snygg bild på uppkoppling och kopplingsnätverk.].
 
 \subsection{Verification}
-The test pulses are to be verified before they are applied to the DUT. The voltage levels and the timings are to be measured, with and without a matched load attached $R_L$ = $R_i$. The standard omits the rise time constraint when the load is attached, except for pulse 3a and 3b. \cite{iso_7637_2}
+The test pulses are to be verified before they are applied to the DUT. The voltage levels and the timings are to be measured both without any load, and with a matched load, $R_L$ = $R_i$, attached. The standard omits the rise time constraint when the load is attached, except for pulse 3a and 3b. \cite{iso_7637_2}
 
 The verification is to be conducted with $U_A$ set to 0. There is, however, a proposal to set $U_A$ to the actual nominal voltage during the verification process, as the behaviour of the pulse generators has proven differ in this case \cite{iso_7637_5}. In this project $U_A = 0$ will be used.
 
 The limits, and tolerances, for the pulses are summarised in \autoref{tab:verification-list}. The matched loads are to be within 1\% of the nominal value. \cite{iso_7637_2}
 
-\begin{table}[h]
+\begin{table}[H]
     \caption{These are all of the verifications that needs to be made before each use of the equipment, along with the limits for each case.}
 \begin{adjustbox}{width=\columnwidth,center}
     %\centering
@@ -305,6 +309,7 @@ The limits, and tolerances, for the pulses are summarised in \autoref{tab:verifi
     \label{tab:verification-list}
 \end{table}
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Differences between the new and the old standard}
 Since the equipment used the project is designed for the older version of the standard, ISO~7637\nd2:2004 and possibly even ISO~7637\nd1:1990 together with ISO~7637\nd2:1990, the differences of importance between these will be presented in this chapter to see what parameters might be a problem for the older equipment to fulfil.
 
@@ -315,7 +320,7 @@ The definition of the DC supply voltage for the DUT differs in some case between
 
 In the older ISO~7637 the definitions could be found in part 2 in clause 4.2. In the newer version these were moved to part 1, clause 5.3. The definition of $U_B$ was moved to ISO~16750\nd1: \hl{SE TILL ATT KOLLA I VILKA KAPITEL I VILKA STANDARDER SAKERNA STÅR NÅGONSTANS}
 
-\begin{table}[h]
+\begin{table}[H]
     \caption{Comparison of the different supply voltage definitions.}
 \begin{adjustbox}{width=\columnwidth,center}
     %\centering
@@ -409,6 +414,12 @@ No change.
 
 No change.
 
+
+\subsection{Summary of critical changes}
+
+\hl{Fyll i de förändringar som gör sakerna striktare}
+
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Resistors at high frequencies}
 \label{theory_parasitic_properties}
 \todo[Ta upp teori kring parasitiska effekter och icke-ideala modeller]
@@ -425,12 +436,13 @@ Chapter 3.1.6 \cite{theCircuitDesignersCompanion}
 
 \autoref{fig:nonIdealResistor}. \cite{theElectricalEngineeringHandbook}
 
-\begin{figure}[h]
+\begin{figure}[H]
     \includegraphics[width=0.5\textwidth]{nonIdealResistor}    
     \caption{At high frequencies a resistors parasitic inductance and capacitance will affect the behavior of the circuit.}
     \label{fig:nonIdealResistor}
 \end{figure}
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Measurement}
 There are several measurement methods needed during the project. To verify the test pulses, voltage has to be measured over time. To verify the dummy loads, resistance has to be measured. To verify the attenuators, their magnitude response has to be measured. This chapter describes the necessary measurement theory required for this project.
 
@@ -474,6 +486,7 @@ Linearity, tolerances, power, combinations of resistors, impedances
 Resistors, Power, Voltages, surges,
 Relays, isolation, dielectric strength
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Analysis}
 The data points from the measurement must be processed and evaluated to determine if the measured pulse is within the specified limits. There are several techniques to accomplish this, which have different advantages.\cite{source}
 
@@ -552,6 +565,7 @@ Shape Properties of Pulses Described by Double Exponential Function and Its Modi
 On the  Design  and  Generation of the Double  Exponential Function S. C. Dutta  Roy and D. K. Bhargava 
 }
 
+%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
 \section{Instrumentation and control}
 The following chapter describes the different instruments that were used, and their control interfaces.